Training school (deadline for registration 28 Sep 2017)
6 Nov 2017 to 8 Nov 2017
Department of Physics, University of Jyväskylä
Survontie 9 C, JyväskyläFinland
- Purpose/aim of event: To first give the participants an introduction to different ion beam analysis techniques, especially in the analysis of thin films followed by a hands-on experience in the art of time-of-flight elastic recoil detection analysis (TOF-ERDA), Rutherford backscattering spectrometry (RBS) and helium ion microscopy (HIM)
- Invited speakers:
- Prof. Mikko Ritala, University of Helsinki, Finland: Importance of ion beam analysis in ALD research
- Prof. Chris Jeynes, University of Surrey, UK: IBA (RBS) basics and application for thin film studies
- Dr. Daniel Primetzhofer, University of Uppsala, Sweden: Medium energy ion scattering
- Dr. Johan Meerschaut, Imec, Belgium: Ion beam analysis in industrial environment at Imec
- Dr. Kai Arstila, University of Jyväskylä, Finland: Helium ion microscopy and spectroscopy
- Prof. Timo Sajavaara: Analysis of light and heavy elements using heavy-ion ERDA
- Scientific program: The training program will consist of lectures on Monday (whole day) and Tuesday morning and then hands-on training using the instruments on Tuesday afternoon. The event will be over by 13.30 on Wednesday and transportation will be arranged to the JYV-HEL plane departing at 15.00
- Social program: There will be a small get-together on Sunday evening starting at 18.00 with a possibility to go to sauna and, if weather permits, a short visit to see the auroras in the countryside. On Monday evening there will be a dinner, Tuesday evening is free.
- Venue: University of Jyväskylä, Finland (a nice Hotel Alba is located just 200 m away from the institute)
- Local organiser: professor Timo Sajavaara and his group
- Organising institution: Department of Physics, University of Jyväskylä, Finland
- Short description of event: The event will consist of lectures in one day to explain the fundamentals of ion beam analysis followed by lectures explaining the state-of-the art of IBA today. A new tool, helium ion microscope, will also be covered. Most of the second and third day will focus in the hand-on training involving both measurements and analysis using TOF-ERDA, RBS and HIM. There is a possibility to bring own samples to measure as well.
- Travel info: Jyväskylä can be easily reached by plane (45 min), train (3.5 h) or by bus (4 h) from Helsinki.
- Cost, number of participants and travel support: The lectures, training and social events are free for the participants (max 15). There is travel support available for HERALD members and to max 4 non-members.
- Diploma: The training is estimated to equal 1 ECTS. A diploma will be given to the participants.
- Registration deadline 28 Sep 2017
For more info and registration, please contact email@example.com